USB eye pattern test mode

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring

Reexamination Certificate

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Details

C702S120000, C702S117000, C702S122000, C326S086000

Reexamination Certificate

active

07103512

ABSTRACT:
A special test mode is incorporated within a USB transceiver of a digital system, and when the special test mode is activated, USB eye pattern test data signal waveforms, e.g., a continuous stream of USB state transitions (defined by the USB specification) are transmitted on the USB data lines connected to the USB transceiver. Conventional test equipment may be attached to the USB data lines and the signal quality monitored. Circuit changes can be made to the digital system and the results easily measured. When the USB eye pattern test data signal waveforms on the USB data lines of the digital system are of satisfactory quality, the special test mode may be turned off and the USB transceiver will resume operation as a normal USB device.

REFERENCES:
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patent: 6717439 (2004-04-01), Ohkubo
patent: 6795327 (2004-09-01), Deng et al.
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patent: 2005/0235172 (2005-10-01), Ohie et al.
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PCT International Search Report with Written Opinion, PCT/US2005/018647, 13 pages, May 26, 2005.
Don Anderson and Dave Dzatko, “Universal Serial Bus System Architecture,” PC System Architecture Series, Second Edition, pp. 25-27, 227-234.
Lee Whetsel, “A Proposed Standard Test Bus and Boundary Scan Architecture,” Texas Instruments Incorporated, pp. 330-333.

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