X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1997-11-21
2000-05-16
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 73, 378 79, G01N 2320
Patent
active
060647175
ABSTRACT:
An unrestricted motion device (10) has a sample holder (12), a detector holder (14) capable of independent multi-dimensional movement, a radiation source (16) and a radiation source holder (42) also capable of independent, multi-dimensional movement. In a preferred embodiment, the radiation source (16) is an x-ray tube. A controller (18) is connected to the sample holder (12) and detector holder (14) as well as to radiation source (16) so as to enable control of the independent movement of the sample holder (12) and detector holder (14), as well as operation of radiation source (16) and independent movement of radiation source (16). So long as any two of the sample holder (12), detector holder (14) or radiation source holder (42) are capable of multi-dimensional, independent movement, the entire diffraction cone (40) can be observed and analyzed. In a preferred embodiment, the holders are robots. Samples 34 of any size, weight or shape are hereby capable of analysis simply and easily and further, by means of controller (18), local amendment, modification, and customizing of the data collection scheme is enabled. By replacing the prior art goniometer (46) with individual independent robots, such that the sample holder (12) is not physically attached or coupled to the robot moving the detector (36) or the robot moving the radiation source (16), the restrictions on sample size, weight and shape are removed. Also, restrictions on coverage of reciprocal space are greatly reduced since the detector (36), radiation source (16) and/or sample holder (12) can be moved out of plane to any location in the robot's accessible envelope of reach. Also, the need for numerous sample holders (12) capable of different axial motions is eliminated and automatic sample changing and tube changing from point to line mode is enabled.
REFERENCES:
patent: 4501011 (1985-02-01), Hauck et al.
patent: 4735451 (1988-04-01), Wojciechowski et al.
patent: 4807273 (1989-02-01), Haendle
patent: 4881177 (1989-11-01), McClean et al.
patent: 5014293 (1991-05-01), Boyd et al.
patent: 5318254 (1994-06-01), Shaw et al.
patent: 5490646 (1996-02-01), Shaw et al.
patent: 5602889 (1997-02-01), Oldendorf et al.
patent: 5603243 (1997-02-01), Finley
Ortega Richard
Winter Delrose
Church Craig E.
Rigaku/USA, Inc.
Shaffer, Jr. J. Nevin
LandOfFree
Unrestricted motion apparatus and method for x-ray diffraction a does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Unrestricted motion apparatus and method for x-ray diffraction a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Unrestricted motion apparatus and method for x-ray diffraction a will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-265432