Unpredictable fault detection using adaptive inference testing t

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Details

371 221, 364580, 364513, G05B 1902, G01R 3128

Patent

active

050017144

ABSTRACT:
A method of using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. A position-dependent, time-ordered test is performed upon the device or assembly to provide a comprehensive error analysis. The error analysis includes an array of error data and information that is time interdependent. Once fault data is stored in memory, a newly-detected fault can be compared with the stored faults. A relationship between the stored fault data and the detected fault is determined. The system indicates the cause of the detected fault to the operator based on stored fault data that is most probably related to the detected fault. Possibilites of faults within the device or assembly are then displayed. This system analysis and range of potential causes can be evaluated by an operator. In this manner, faults not having been contemplated by stored data and information in the adaptive inference system and not bearing a direct relationship to a problem being reviewed can be identified.

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