Universally accessible fully programmable memory built-in...

Details Universally accessible fully programmable memory built-in... Universally accessible fully programmable memory built-in...

2005-10-25

2005-10-25

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C711S005000, C714S042000

Reexamination Certificate

active

06959256

ABSTRACT:
A universally accessible fully programmable memory built-in self-test (MBIST) system including an MBIST controller having an address generator configured to generate addresses for a memory under test, a sequencer circuit configured to deliver test data to selected addresses of the memory under test and reading out that test data, a comparator circuit configured to compare the test data read out of the memory under test to the test data delivered to the memory under test to identify a memory failure, and an externally accessible user programmable pattern register for providing a pattern of test data to the memory under test. The system includes an external pattern programming device configured to supply the pattern of test data to the user programmable data pattern register.

REFERENCES:
patent: 6452848 (2002-09-01), Obremski et al.
patent: 2004/0190331 (2004-09-01), Ross et al.

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