Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-12-14
2000-07-18
Karlsen, Ernest
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, 324765, G01R 1073, G01R 3128
Patent
active
060912545
ABSTRACT:
A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consists of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical test equipment. A rigid substrate has conductors thereon which establish electrical contact with the wafer. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical testing, it is possible to establish interconnection between the single die or separate and package dice into discrete parts, arrays or clusters, either as singulated parts or as arrays.
REFERENCES:
patent: 4585991 (1986-04-01), Reid et al.
patent: 4597617 (1986-07-01), Enochs
patent: 4766371 (1988-08-01), Moriya
patent: 4783719 (1988-11-01), Jamison
patent: 4899107 (1990-02-01), Corbett et al.
patent: 4918374 (1990-04-01), Stewart et al.
patent: 4924589 (1990-05-01), Leedy
patent: 4968931 (1990-11-01), Littlebury et al.
patent: 4994735 (1991-02-01), Leedy
patent: 5020219 (1991-06-01), Leedy
patent: 5034685 (1991-07-01), Leedy
patent: 5088190 (1992-02-01), Malhi et al.
patent: 5103557 (1992-04-01), Leedy
patent: 5123850 (1992-06-01), Elder et al.
patent: 5440240 (1995-08-01), Wood et al.
patent: 5539324 (1996-07-01), Wood et al.
Corbett Tim J.
Wood Alan G.
Karlsen Ernest
Micro)n Technology, Inc.
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