Universal test fixture employing interchangeable wired personali

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 73PC, 324158P, 339117P, G01R 3102, H01R 464

Patent

active

043520618

ABSTRACT:
A universe of probes is contained within a platen in a spaced-apart, substantially parallel relationship with one another with their tips pointing in the same direction. Each probe is free to move longitudinally between an advanced or test position and a retracted position. The platen nests into a wired personalizer having probe selector posts upstanding therein in a pattern corresponding to the pattern of test points on a circuit board to be tested. These posts serve to push up or advance the probes needed to test a particular type of circuit board. The posts are conductive and each is individually connected to the test system. The circuit board to be tested rests on a special deformable gasket so that its test points are suspended over and aligned with the advanced test probes. When the fixture is evacuated, the circuit board to be tested is drawn downwardly so that the test points on the board make electrical contact with the tips of the advanced probes.

REFERENCES:
patent: 3176091 (1965-03-01), Hanson et al.
patent: 3564408 (1971-02-01), Schulz et al.
patent: 3654585 (1972-04-01), Wickersham
patent: 4017793 (1977-04-01), Haines
patent: 4108528 (1978-08-01), Long et al.
patent: 4115735 (1978-09-01), Stanford
patent: 4322682 (1982-03-01), Schadwill
Tech. Bull. TB 7005-1; "Formed Pin Transition Board"; 1976; Ditmco International; Kansas City, Mo.

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