Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1985-02-21
1987-04-14
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
356244, G01B 902, G01J 345, G01N 2113
Patent
active
046573909
ABSTRACT:
A spectrometer system is disclosed in which the sample-containing chamber is a separately constructed, enclosed modular unit which is readily attachable to, and detachable from, one wall of a housing which constitutes the basic unit of the spectrometer, and which contains an interferometer, one or more detectors, and other portions of the system. Various examples of the essentially unlimited types of sampling modules are disclosed. Also, automatic sample loading and unloading devices are disclosed, which are feasible because of the modular construction. And means of loading and unloading samples without purge loss are disclosed, which are feasible because of the modular construction.
REFERENCES:
patent: 3806259 (1974-04-01), Boostrom et al.
patent: 4120592 (1978-10-01), Fleming et al.
patent: 4286877 (1981-09-01), Clarke
"Beckman Beam Condenser for IR-4200" Beckman Instructions 015-555357, Oct. 1976, pp. 1-4.
Laser Precision Corporation
McGraw Vincent P.
Plante Thomas J.
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