Universal padset concept for high-frequency probing

Details Universal padset concept for high-frequency probing Universal padset concept for high-frequency probing

2007-01-02

2007-01-02

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S1540PB

Reexamination Certificate

active

11221327

ABSTRACT:
A universal, substrate Padset for de-embedding pad and signal line parasitics has an input pad group including a first input signal pad and a first ground pad; an output pad group including a first output signal pad and a second ground pad; a first input-signal-routing network for routing the first input signal pad to a first input node of a first predetermined test device; a first output-signal-routing network for routing the first output signal pad to a first output node of the first predetermined test device; a second input-signal-routing network for routing the first input signal pad to a second input node of a second predetermined test device; and a second output-signal-routing network for routing the first output signal pad to a second output node of the second predetermined test device. The layout configuration of the first test device is different from the layout configuration of the second test device.

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