Universal nondestructive MM-wave integrated circuit test fixture

Details Universal nondestructive MM-wave integrated circuit test fixture Universal nondestructive MM-wave integrated circuit test fixture

1989-08-10

1990-12-25

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, 324601, 333247, G01R 100, G01R 104

Patent

active

049806360

ABSTRACT:
An MMIC test fixture includes a bias module having spring-loaded contacts which electrically engage pads on a chip carrier disposed in a recess of a base member. RF energy is applied to and passed from the chip carrier by chamfered edges of ridges in the waveguide passages of housings which are removably attached to the base member. "Thru", "Delay" and "Short" calibration standards having dimensions identical to those of the chip carrier assure accuracy and reliability of the test. The MMIC chip fits in an opening in the chip carrier with the boundaries of the MMIC lying on movable reference planes thereby establishing accuracy and flexibility.

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R.F. Characterization of Monolithic Microwave and mm-Wave ICs, NASA Technical Memorandum 88948, R. R. Romanofsky et al., 11/86.

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