Geometrical instruments – Gauge – Center – point – distance between centers – or centerline location
Reexamination Certificate
2007-01-31
2008-09-23
Bennett, G. Bradley (Department: 2841)
Geometrical instruments
Gauge
Center, point, distance between centers, or centerline location
C033S783000
Reexamination Certificate
active
07426789
ABSTRACT:
A measuring apparatus for measuring an object includes a base member including a portion having a medial cavity and an extendible member that slidably engages the medial cavity of the base member. The extendible member includes a medial member having a mid point indicator defined by an elongate medial passageway, and a point locator defined by a passageway formed through an end portion thereof. The extendible member also includes a pair of opposing flexible members connected to the medial member. Each one of the pair of opposing flexible members have point locators defined by passageways formed through end portions thereof. The measuring apparatus also includes an intersection member connected to the point locaters on the pair of opposing flexible members, and a plurality of sets of measurement marks carried by at least one of the base member and the extendible member relating to a predetermined measurement of the object to be measured.
REFERENCES:
patent: 2780874 (1957-02-01), Puckett
patent: 2826820 (1958-03-01), Zelnick
patent: 3173211 (1965-03-01), Williams
patent: 3762057 (1973-10-01), Kaifesh
patent: 4682420 (1987-07-01), Teets
patent: 4766675 (1988-08-01), Liu
patent: 4848757 (1989-07-01), De Fazio
patent: 5172484 (1992-12-01), Triola
patent: 5616917 (1997-04-01), Dai
patent: 5669150 (1997-09-01), Guertin et al.
patent: 6076270 (2000-06-01), Figliuzzi
patent: 6240646 (2001-06-01), Ronnmark et al.
patent: 6381861 (2002-05-01), Deterling
patent: 6510618 (2003-01-01), Tomiser, Jr. et al.
patent: 6959573 (2005-11-01), Matsumoto et al.
patent: 7191537 (2007-03-01), Kraus et al.
patent: 2005/0235511 (2005-10-01), Tkachyk
Kraus Andrew Patrick
Peltz David Michael
Bennett G. Bradley
Engineered Devices & Solutions, LLC
Malek, Esquire Mark R.
Sutch & Malek
Widerman Zies
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