Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
1998-10-19
2001-08-07
Nguyen, Vinh P. (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
06271658
ABSTRACT:
FIELD OF THE INVENTION
The invention relates to the field of semiconductor processing, and more specifically to docking and undocking of an electronic test head with a device handler.
DESCRIPTION OF THE PRIOR ART
In the automatic testing of integrated circuits (IC) and other electronic devices, special device handlers have been used which place the device to be tested in position. The electronic testing itself is provided by a large and sophisticated automatic testing system that includes a test head. The test head is required to connect to and dock with the device handler. In such testing systems, the test head is usually very heavy. The reason for this heaviness is that the test head uses high-speed electronic timing signals. The electronic test circuits must therefore be located as close as possible to the device under test. Accordingly, the test head has been densely packaged with electronic circuits in order to achieve the high speed testing of the state of the art devices.
The state of the art left much to be desired in providing a manipulator or positioner to easily move the heavy test head accurately in position with respect to the device handler mechanism. The user has had to move the heavy device handler or the heavy positioner itself in order to provide alignment. When the test head is accurately in position with respect to the device handler, the test head and the device handler are said to be aligned. When the test head and the device handler are aligned, the fragile test head and the device handler electrical connections can be brought together (that is docked) enabling the transfer of test signals between the test head and the device handler. Prior to docking, the test head and the device handler electrical connections must be precisely aligned to avoid damaging the electrical connectors.
In a typical electrical test environment, the test head is manually guided to connect delicate electrical pins to the contacting plate of the device handler without alignment guides after which the test head is locked or kept level by means of a device manipulator. This often presents problems during production testing. For instance, the test head can drop in position and loose the electrical connections with the device handler. Or the device handler vibrates causing intermittent electrical connections with the device test head or even causing damage to the electrical equipment.
U.S. Pat. No. 5,440,943 (Holt et al) shows a positioner that facilitates docking and undocking of an electronic test head with a device handler.
U.S. Pat. No. 5,149,029 (Smith) discloses a system for positioning an electronic test head with respect to an electronic device handler.
U.S. Pat. No. 5,450,766 (Holt) shows a test head manipulator for positioning a test head with respect to a device handler.
U.S. Pat. No. 5,608,334 (Holt) shows a device testing system.
U.S. Pat. No. 4,527,942 (Smith) shows an electronic test head positioner for test systems.
U.S. Pat. No. 4,588,346 (Smith) shows a method for positioning an electronic test head.
SUMMARY OF THE INVENTION
The present invention addresses the problems of quickly and reliably positioning and interlocking a device handler head with respect to a device tester head.
The primary objective of the present invention is to provide an apparatus for establishing quick and reliable connections between the semiconductor device handler and the semiconductor device tester.
Another objective of the present invention is to reduce the negative effect on device yield caused by unreliable device handler to device tester connection.
Yet another objective of the present invention is to reduce the need for device re-testing due to unreliable testing results caused by unreliable device handler to device tester connections (re-screen downtimes).
Yet another objective of the present invention is to reduce the downtime required for changing equipment set-up within the semiconductor testing and manufacturing environments.
Yet another objective of the present invention is to facilitate the required equipment conversions between different device testing set-up configurations; such that the testhead can be docked securely to the device handler on either 0-degree, 90-degree, or 180-degree positions; such that the device testhead can be docked securely to the device handler on either single-site, double-site or three-site contacts; and such that the device testhead can be docked securely to the device handler on a multiplicity of, different thicknesses of the electronic contactors.
The present invention teaches a system for positioning an electronic test head with respect to an electronic device handler. This system comprises two interface plates and an arrangement of mounting brackets to connect the interface plates to the device handler and the device tester respectively. The present invention addresses the problem of quickly and reliably positioning a device handler plate with respect to a device test head plate. The device handler plate is used in moving the semiconductor device between positions, the device test head plate is used when testing the semiconductor device. The present invention relieves problems of questionable yield fallout, excessive downtime for re-testing and equipment set-up.
REFERENCES:
patent: 4527942 (1985-07-01), Smith
patent: 4588346 (1986-05-01), Smith
patent: 5149029 (1992-09-01), Smith
patent: 5440943 (1995-08-01), Holt et al.
patent: 5450766 (1995-09-01), Holt
patent: 5552701 (1996-09-01), Veteran et al.
patent: 5608334 (1997-03-01), Holt
Tan Chee-Keong
Vallinan John Zenon G.
Ackerman Stephen B.
Nguyen Vinh P.
Saile George O.
ST Assembly Test Services Pte, Ltd.
LandOfFree
Universal Docking System does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Universal Docking System, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Universal Docking System will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2469935