Universal burn-in driver system and method therefor

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364580, 371 23, 3241581, 324765, G06F 1520

Patent

active

053901290

ABSTRACT:
An improved driver system and method therefor for the accelerated life testing of semiconductor devices is described in which a universal burn-in driver system which can be reconfigured by computer control is used to accomplish the efficient signal conditioning, testing and data collection for a wide variety of semiconductor devices with a minimum of system setups and change-overs. The ability of the driver system to be reconfigured by computer control allows at least one group of electronic devices of the same type and at least another group of electronic devices of a different type to be tested by the same burn-in driver without the necessity for mechanical change-over or the use of separate different driver board designs.

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