Uniform temperature environmental testing method for semiconduct

Details Uniform temperature environmental testing method for semiconduct Uniform temperature environmental testing method for semiconduct

1999-09-02

2000-09-05

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, 324765, 438 17, G01R 3102

Patent

active

061148687

ABSTRACT:
A method and apparatus for maintaining a uniform temperature of semiconductor devices mounted on a burn-in board. A cover is positioned on the burn-in board to enclose all of the semiconductor devices mounted on the board. A plurality of such burn-in boards are then placed in a burn-in oven of conventional design for burn-in testing of the semiconductor devices. The cover prevents a non-uniform airflow along the semiconductor devices which would cause the semiconductor devices to have a non-uniform temperature distribution.

REFERENCES:
patent: 4899107 (1990-02-01), Corbett et al.
patent: 4967155 (1990-10-01), Magnuson
patent: 5103168 (1992-04-01), Fuoco
patent: 5180974 (1993-01-01), Mitchell et al.
patent: 5694049 (1997-12-01), Singh et al.

Affiliated with

Also associated with

Rating

Uniform temperature environmental testing method for semiconduct does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Uniform temperature environmental testing method for semiconduct, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Uniform temperature environmental testing method for semiconduct will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2215926