Uniform temperature environmental testing apparatus for semicond

Details Uniform temperature environmental testing apparatus for semicond Uniform temperature environmental testing apparatus for semicond

1996-04-24

2000-11-28

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, 324765, G01R 3102

Patent

active

061540420

ABSTRACT:
A method and apparatus for maintaining a uniform temperature of semiconductor devices mounted on a burn-in board. A cover is positioned on the burn-in board to enclose all of the semiconductor devices mounted on the board. A plurality of such burn-in boards are then placed in a burn-in oven of conventional design for burn-in testing of the semiconductor devices. The cover prevents a non-uniform airflow along the semiconductor devices which would cause the semiconductor devices to have a non-uniform temperature distribution.

REFERENCES:
patent: 4899107 (1990-02-01), Corbett et al.
patent: 4967155 (1990-10-01), Magnuson
patent: 5103168 (1992-04-01), Fuoco
patent: 5180974 (1993-01-01), Mitchell et al.
patent: 5694049 (1997-12-01), Singh et al.

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