Optics: measuring and testing – Document pattern analysis or verification
Patent
1986-02-27
1988-03-01
Rosenberger, R. A.
Optics: measuring and testing
Document pattern analysis or verification
356448, G06K 974
Patent
active
047281863
ABSTRACT:
An uneven-surface data detection apparatus, includes a transparent plate having an uneven-surface contact portion against which an uneven surface to be detected is pressed. A light source illuminates the uneven-surface contact portion through the transparent plate. An uneven-surface image drawing out optical element draws out the light reflected on the uneven-surface contact portion of the transparent plate. A detector detects the light drawn out from the transparent plate by the optical element.
Light reflected by a projection-facing portion of the uneven surface contact portion to be introduced into the detector diverges from a propagation direction of light reflected by a recess-facing portion of the uneven surface contact portion. The optical element is arranged to guide the light reflected by the projection-facing portion into the detector.
REFERENCES:
patent: 3716301 (1973-02-01), Caulfield et al.
patent: 3864042 (1975-02-01), Leventhal
patent: 3865488 (1975-02-01), Del Rio
patent: 4428670 (1984-01-01), Ruell et al.
Opto-Electronics, Nikkan Kogyo Press Co., Japan, pp. 120-125.
Optical Holography, Academic Press, pp. 18-23.
Eguchi Shin
Igaki Seigo
Ikeda Hiroyuki
Inagaki Takefumi
Yahagi Hironori
Cooper Crystal D.
Fujitsu Limited
Rosenberger R. A.
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