Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2004-05-14
2009-10-20
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07605598
ABSTRACT:
An on-state low current detector uses a transistor with main (32) and sense (34) cells. Feedback circuit (36) acts to keep the voltage across main cells (32) at a substantially constant target value when the load current falls below a level that generates the target voltage value in the main cells. The target voltage value is sufficiently high to ensure that the voltages of low current detection comparator (18) are readily measurable.
REFERENCES:
patent: 4743779 (1988-05-01), Valley
patent: 5018041 (1991-05-01), Szepesi
patent: 5760613 (1998-06-01), Pulvirenti et al.
patent: 5815027 (1998-09-01), Tihanyi et al.
patent: 6624994 (2003-09-01), Schmoock et al.
Nguyen Ha Tran T
NXP B.V.
Velez Roberto
LandOfFree
Undercurrent sense arrangement and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Undercurrent sense arrangement and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Undercurrent sense arrangement and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4093629