Measuring and testing – Gas analysis – By thermal property
Patent
1989-07-31
1990-09-04
Williams, Hezron E.
Measuring and testing
Gas analysis
By thermal property
422 98, G01N 2712
Patent
active
049533878
ABSTRACT:
A device for detecting a gaseous species including (i) a silicon substrate having two major surfaces and comprising a dielectric window region (ii) a heater situated on the dielectric window region on one major surface; and (iii) a conductivity cell electrode thin metal transducing film assembly situated on the dielectric window region on the other major surface is disclosed. The thin transducing film contacts the conductivity cell electrode.
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Johnson Christy L.
Schwank Johannes
Wise Kensall D.
Roskos Joseph W.
The Regents of the University of Michigan
Williams Hezron E.
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