Measuring and testing – Vibration – By mechanical waves
Patent
1984-11-14
1986-02-18
Birmiel, Howard A.
Measuring and testing
Vibration
By mechanical waves
73616, G01N 2900
Patent
active
045704864
ABSTRACT:
An ultrasonic thickness gauge circuit includes a dual transducer probe and a logic circuit for providing square wave signals whose duration is equal to the time interval between the ultrasonic signal entering a workpiece to be measured and the reception of the ultrasonic signal reflected at the rear surface of the workpiece. When measuring thin wall thicknesses a measuring error arises due to the "V"-shaped transit path of the ultrasonic signals being greater than twice the wall thickness of the workpiece. A low-pass filter and a comparator are provided for modifying the square wave signals to effect correction. The modified signal is then used for providing clock pulses, the quantity of which is a measure of the wall thickness of the workpiece.
REFERENCES:
patent: 4182155 (1980-01-01), Fowler
patent: 4388830 (1983-06-01), Narushima
patent: 4437332 (1984-03-01), Pittaro
Birmiel Howard A.
Feig Philip J.
Krautkramer-Branson, Inc.
Steinberg Ervin B.
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