Measuring and testing – Vibration – By mechanical waves
Patent
1984-06-14
1985-10-08
Kreitman, Stephen A.
Measuring and testing
Vibration
By mechanical waves
73 1DV, G01N 2900
Patent
active
045452482
ABSTRACT:
An ultrasonic thickness gauge including a split-type probe to perform the transmission-reception of ultrasonic waves via a material board to be measured, a zero point calibration circuit to delay the zero point by a specified delay time from the wave transmission timing, and a measuring circuit to count clock pulses for the duration from the zero point to the wave reception timing. This ultrasonic thickness gauge is characterized in that it also includes a counter to count, within specified range, the clock pulses relating to the board thickness in each previous measurement conducted by using the preset zero point, and a zero point adjusting circuit to vary the zero point of the zero point calibration circuit in proportion to the count value of the above-mentioned counter. In addition, a coefficient selecting circuit to shift the proportionality coefficient of the zero point adjusting circuit step by step in accordance with the board thickness obtained in each previous measurement may be included for measuring a wider range of board thickness.
REFERENCES:
patent: 3504532 (1970-04-01), Muenow et al.
patent: 4088028 (1978-05-01), Hildebrandt
patent: 4307611 (1981-12-01), Opara
patent: 4388830 (1983-06-01), Narushima et al.
patent: 4437332 (1984-03-01), Pittaro
Arioka Takanori
Kitada Toyohiko
Kabushiki Kaisha Tokyo Keiki
Kreitman Stephen A.
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