Measuring and testing – Vibration – By mechanical waves
Patent
1985-05-17
1986-04-08
Levy, Stewart J.
Measuring and testing
Vibration
By mechanical waves
73642, 128660, G01N 2900
Patent
active
045804516
ABSTRACT:
An ultrasonic sector-scan probe comprises at least an array having a plurality of ultrasonic transducer segments, a window for transmitting and receiving ultrasonic waves and an ultrasonic wave propagation medium filled in a front space between the array and the window. A group of the ultrasonic transducer segments are selectively driven as an aperture and ultrasonic waves emitted therefrom are converged into a beam for transmission and reception. By partly or entirely changing the segments in the group with the ones outside the group the scan line is shifted to a new angle, and a member under test contacted with the window on the outside thereof is sector-scanned by the ultrasonic beam. The array is arranged so that scanning lines of the groups intersect at one point in the window or in its vicinity for sector scan. An acoustic lens is provided in the window or in its vicinity so that the ultrasonic beam may be converged over the measuring depth range of the member under test with or without phase control of the segments in the group. Furthermore, the array is arranged multidimensionally or in plural linear arrays so that the scanning lines of the groups intersect substantially at one point in the window or in its vicinity for sector scan, thereby performing sector scan of at least two sections and/or three-dimensional sector scan.
REFERENCES:
patent: 3245251 (1966-04-01), von Ardenne
patent: 3881164 (1975-04-01), Kossoff
patent: 4183249 (1980-01-01), Anderson
patent: 4204435 (1980-05-01), Bridoux et al.
patent: 4281550 (1981-08-01), Erikson
patent: 4340944 (1982-07-01), Dory
Hayashi Hajime
Iida Atsuo
Kawabe Kenji
Miwa Hirohide
Shimura Takaki
Chapman, Jr. John E.
Fujitsu Limited
Levy Stewart J.
LandOfFree
Ultrasonic sector-scan probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ultrasonic sector-scan probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ultrasonic sector-scan probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2059442