Ultrasonic microscope system

Details Ultrasonic microscope system Ultrasonic microscope system

1984-04-02

1985-09-17

Birmiel, Howard A.

Measuring and testing

Vibration

By mechanical waves

73602, 73619, 73607, G01N 2904

Patent

active

045412812

ABSTRACT:
An ultrasonic transmitter-receiver for radiating a focused ultrasonic beam and a sample are moved relative to each other in the axial direction of the ultrasonic beam. A reflected wave from the sample is received and a curve V(Z) of variations in the level of the reflected wave with respect to the relative movement is obtained. A reference level of interference of a directly reflected wave and a leaky elastic wave is subtracted from V(Z) to perform waveform processing. The waveform processing output is subjected to a waveform analysis, and from the analysis results, the velocity and/or the attenuation of the leaky elastic wave are calculated.

REFERENCES:
patent: 4378699 (1983-04-01), Wickramasinghe
patent: 4491020 (1985-01-01), Chubachi

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