Metal fusion bonding – Process of disassembling bonded surfaces – per se
Patent
1997-01-06
1998-07-21
Bradley, P. Asutin
Metal fusion bonding
Process of disassembling bonded surfaces, per se
228 19, 29762, 310333, B23K 1018
Patent
active
057824037
ABSTRACT:
A device for removal of a semiconductor chip interconnected to a substrate package via solder ball connections, for instance, includes an ultrasonic transducer for providing lateral ultrasonic vibration. A converter is coupled between the ultrasonic transducer and semiconductor chip for converting the lateral ultrasonic vibration to a torsional ultrasonic vibration, wherein the torsional ultrasonic vibration is perpendicular to the lateral ultrasonic vibration. The lateral-to-torsional converter further applies the torsional ultrasonic vibration to the chip for facilitating its removal from the substrate package. A method for removal of a semiconductor chip interconnected to a substrate package is also disclosed.
REFERENCES:
patent: 5164037 (1992-11-01), Iwami et al.
patent: 5172469 (1992-12-01), Onda et al.
patent: 5216803 (1993-06-01), Nolan et al.
patent: 5326014 (1994-07-01), Morita et al.
patent: 5662766 (1997-09-01), Ishikawa et al.
"Use of Ultrasonics for Integrated Circuit Chip Removal," IBM Technical Disclosure Bulletin, vol. 23, No. 3 Aug. 1980, p. 979.
"Ultrasonic Method to Remove Chips Mounted on Ceramic or of Other Materials Substrates," Research Disclosure, Aug. 1991, No. 328.
"Ultrasonic Chip Removal from Burn-In Substrates," Research Disclosure, May 1992, No. 337.
Blecker Ira D.
Bradley P. Asutin
International Business Machines - Corporation
Knapp Jeffrey T.
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