Ultrafast laser pulse shape measurement method and system

Details Ultrafast laser pulse shape measurement method and system Ultrafast laser pulse shape measurement method and system

2007-06-12

2007-06-12

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

Reexamination Certificate

active

11006109

ABSTRACT:
A laser pulse shape measuring system to measure the pulse shape of pulses generated by a pulsed laser. Each pulse includes a pulse width and a peak wavelength. The system includes: a beam splitter coupled to the laser to separate each of the pulses into a test pulse and a probe pulse; a pulse width compression means coupled to the beam splitter to compress the pulse width of each probe pulse; a controllable delay means to control a time offset between each test pulse and a corresponding probe pulse; a nonlinear optical medium arranged such that the test beam path and the probe beam path intersect within it to generate wavelength converted pulses corresponding to intersecting pairs of pulses; a detector coupled to the nonlinear optical medium to detect the pulse energies of the wavelength converted pulses; and a processor to determine the pulse shape of the laser pulses.

REFERENCES:
patent: 5479256 (1995-12-01), Tamai et al.
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5754292 (1998-05-01), Kane et al.
patent: 6219142 (2001-04-01), Kane
patent: 6819428 (2004-11-01), Ogawa

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