Ultracapacitor useful life prediction

Details Ultracapacitor useful life prediction Ultracapacitor useful life prediction

2006-07-25

2006-07-25

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S426000, C324S427000, C324S430000, C324S434000

Reexamination Certificate

active

07081761

ABSTRACT:
Methods and apparatus are provided for projecting the useful life Yprojof an ultracapacitor undergoing at least one ON period after an OFF period. The apparatus comprises sensors coupled to the ultracapacitor for measuring the instantaneous voltage V(t) and temperature T(t) thereof as a function of time t, and a measuring system coupled to the sensors, the measuring system receiving V(t), T(t) and computing Yprojbased at least in part on combining values of the instantaneous ultracapacitor life Y(V(t),T(t))=10(aT+bV+c)where a, b and c are constants, for different values of t. The measuring system preferably includes program, temporary and non-volitile memory, a processor, a timer and an I/O for communicating with the sensors and other vehicle systems. In a preferred embodiment, values of V(t), T(t) at the beginning and end of the OFF period are also used in determining Yproj.

REFERENCES:
patent: 4947123 (1990-08-01), Minezawa
patent: 5394089 (1995-02-01), Clegg
patent: 6137292 (2000-10-01), Hirsch et al.
patent: 6642719 (2003-11-01), Seto
patent: 6842708 (2005-01-01), Odaohhara
patent: 6880967 (2005-04-01), Isozumi et al.

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