Ultra-short low-force vertical probe test head

Details Ultra-short low-force vertical probe test head Ultra-short low-force vertical probe test head

2008-07-01

2008-07-01

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11058974

ABSTRACT:
A playground play feature comprising a track having a glide board thereon, such that a user may run and jump onto the glide board and propel the board along the length of the track. The glide board further can comprise a rubber, or similar material, covered board having wheels, the wheels designed to fit within angled side rails, so that the glide board is held onto the track along the entire length of the track. The track further comprises shock absorbing end caps so as to more controllably stop the glide board as it nears the end of the track.

REFERENCES:
patent: 4724383 (1988-02-01), Hart
patent: 5252916 (1993-10-01), Swart
patent: 5389885 (1995-02-01), Swart
patent: 5990697 (1999-11-01), Kazama
patent: 6084421 (2000-07-01), Swart et al.
patent: 6356098 (2002-03-01), Akram et al.
“COBRA Vertical Technology Probe Cards”, Available from http://www.wentworthlabs.com/product/cobra.htm, 3 pages.
“Yield-Enhancing WaferProbe PH-Series Probe Cards”, Available from http://www.formfactor.com/FormFactor%20Online/downloadables/WaferProbe%20PH-Series.pdf,2 pages.
“ U.S. Appl. No. 10/335,188 Final office action mailed Jun. 8, 2004”, 8 pgs.
“ U.S. Appl. No. 10/335,188 Non-final office action mailed Jan. 7, 2004”, 8 pgs.
“ U.S. Appl. No. 10/335,188 Notice of allowance mailed May 3, 2006”, 7 pgs.
“ U.S. Appl. No. 10/335,188 Notice of allowance mailed Dec. 9, 2004”, 5 pgs.
“ U.S. Appl. No. 10/335,188 Response filed Mar. 8, 2004”, 29 pgs.
“U.S. Appl. No. 10/335,188 Response filed Sep. 8, 2004 in response to Final Office Action mailed Jun. 8, 2004”, 12 pgs.
“U.S. Appl. No. 10/335,188 Response filed Nov. 8, 2004 in response to Final Office Action mailed Sep. 8, 2004”, 7 pgs.

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