Chemistry: analytical and immunological testing – Measurement includes temperature change of the material...
Reexamination Certificate
2008-01-16
2011-12-13
Mui, Christine T (Department: 1774)
Chemistry: analytical and immunological testing
Measurement includes temperature change of the material...
C422S051000, C422S050000
Reexamination Certificate
active
08076151
ABSTRACT:
Methods and apparatus for ultra-sensitive temperature sensing and calorimetry. Radiation is directed at a thin electrically conductive film having one or more small apertures. The incident radiation excites surface plasmons on a first surface of the electrically conductive film, and energy associated with the surface plasmons couples to an opposite surface of the electrically conductive film, where surface plasmon-enhanced radiation (SPER) is emitted from the aperture(s). A temperature-sensitive fluid or solid dielectric material is disposed contiguous with at least a portion of the electrically conductive film, such that a temperature change in the dielectric material alters a resonance condition for the SPER. Measurable changes in the SPER due to altered resonance conditions provide for an ultrasensitive temperature sensor that can detect small temperature changes in the dielectric material. The disclosed methods and apparatus may be used for a variety of applications including, but not limited to, nanoscale to microscale calorimetry for pharmaceutical and biotechnology products, combustion sensing, explosive detection, and biotoxin monitoring.
REFERENCES:
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patent: 2006/0159585 (2006-07-01), Torres et al.
patent: 1686360 (2006-08-01), None
Herminghaus et al., “Surface Plasmon Enhanced Transient Thermoreflectance,”Appl. Phys. A 51:350-353 (1990).
International Written Opinion for PCT/US2008/000580 mailed Jul. 30, 2009.
International Search Report for PCT/US2008/000580 mailed Sep. 26, 2008.
Kowalski Gregory
Larson Dale N.
Mui Christine T
Northeastern University
President and Fellows of Harvard College
Wolf Greenfield & Sacks P.C.
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