Ultra-low particle semiconductor cleaner

Cleaning and liquid contact with solids – Processes – Work handled in bulk or groups

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134 2, 134 21, 134 255, 134 26, 134 30, 134 37, 134902, B08B 920

Patent

active

061584460

ABSTRACT:
A method for cleaning a semiconductor wafer. The method includes immersing a wafer in a liquid comprising water. The wafer has a front face, a back face, and an edge. The method also includes providing a substantially particle free environment adjacent to the front face and the back face as the liquid is being removed. A step of introducing a carrier gas comprising a cleaning enhancement substance during the providing step also is included. The cleaning enhancement substance dopes the liquid which is attached to the front face and the back face to cause a concentration gradient of the cleaning enhancement substance in the attached liquid to accelerate fluid flow of the attached liquid off of the wafer.

REFERENCES:
patent: 5421905 (1995-06-01), Ueno et al.
patent: 5571337 (1996-11-01), Mohindra et al.
patent: 5634978 (1997-06-01), Mohindra et al.
patent: 5772784 (1998-06-01), Mohindra et al.

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