Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate
2007-09-26
2010-12-14
Chapman, John E (Department: 2856)
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
C073S514360, C073S514380
Reexamination Certificate
active
07849745
ABSTRACT:
Sensing structures are provided which are designed using non-conventional designs. These sensing structures have improved sensitivity and noise floor at low frequencies.
REFERENCES:
patent: 5209117 (1993-05-01), Bennett
patent: 5412986 (1995-05-01), Beringhause et al.
U.S. Appl. No. 11/097,059, filed Mar. 31, 2005, Wang et al.
F. Gerfers, et al., “Fabrication and Characterization of Bulk-micromachined Accelerometers Based on AIN Piezoelectric Sensing and SOI Wafers”, Proceedings of Eurosensors, Sep. 2006.
L.-P. Wang, et al., “Design, Fabrication, and Measurement of High-Sensitivity Piezoelectric Microelectromechanical Systems Accelerometers,” IEEE Micromechanical Systems, vol. 12, No. 4, Aug. 2003.
F. Levinzon, “Fundamental Noise Limit of Piezoelectric Accelerometer”, IEEE Sensors Journal, vol. 4, No. 1, Feb. 2004.
Christopher McLean and Dave Wolfe, “Intelligent Wireless” Techkor Instrumentation, Machine Monitoring/Networking, Jun. 2002 http://archives.sensorsmag.com/articies/0602/14/main.shtml.
Gerfers Friedel
He Ming-Yuan
Wang Li-Peng
Chapman John E
Intel Corporation
Pearl Cohen Zedek Latzer LLP
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