Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-09-01
1989-10-17
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158D, 324158F, 324 73PC, 324 96, G01R 1900, G01R 528
Patent
active
048750069
ABSTRACT:
A high-speed test system for semiconductor integrated circuits utilizes electro-optic sampling techniques to perform tests at data rates up to 1.2 Gb/s. The receiver portion of the tester has a 4.5 GHz bandwidth and can perform ECL level functional test with one sampling pulse per vector. A device under test is positioned in a test head with an electro-optic birefringent crystal sensor positioned below the device under test to minimize signal path length. A system control unit includes a Nd: YAG modelocked laser which generates optical pulses, and optical transmission means directs the optical pulses to an array of reflective contacts on the sensor. The sensor functions as a Pockels cell with the electric field in the crystal sensor due to voltages on the array of contacts changing the transmission of polarized light through the crystal. Reflected pulses are received and converted to electrical signals indicative of the voltages on the array of contacts on the electro-optic sensor.
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patent: 4269483 (1981-05-01), Feldtkeller
patent: 4446425 (1984-05-01), Valdmanis et al.
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4681449 (1987-07-01), Bloom et al.
Yariv; "The Modulation of Optical Radiation", Quantum Electronics, 1975; pp. 327-351.
Barr Maurice R.
Choi Hee-June
Henley Francois G.
Kratzer Dean J.
Eisenzopf Reinhard J.
Nguyen Vinh P.
Photon Dynamics, Inc.
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