Optics: measuring and testing – Of light reflection
Patent
1990-10-11
1992-03-17
Rosenberger, Richard A.
Optics: measuring and testing
Of light reflection
359350, G02B 522
Patent
active
050963007
ABSTRACT:
The ultra-black film is disclosed, which essentially consists of a base, a Ni-P alloy layer formed on said base and a phosphate layer formed on said Ni-P layer, the spectral reflectance of said ultra-black film being 0.04 to 0.4%. The invention provides an apparatus for measuring the reflectance utilizing in connection therewith an adapter which has an inner surface provided with an ultra-black film.
REFERENCES:
patent: 3208447 (1965-09-01), Laszlo
patent: 3357854 (1967-12-01), Hays
patent: 4122239 (1978-10-01), Riboulet et al.
patent: 4209008 (1980-06-01), Lemkey et al.
patent: 4233107 (1980-11-01), Johnson, Sr.
patent: 4343552 (1982-08-01), Blades
patent: 4361630 (1982-11-01), Johnson, Sr.
patent: 4511614 (1985-04-01), Greeson et al.
patent: 4596460 (1986-06-01), Davinson
"Black Electroless Nickel Surface Morphologies with Extremely High light Absorption Capacity", by Christian E. Johnson, National Bureau of Standards, Washington, D.C.; Metal Finishing, Jul. 1980; vol. 78.
Literature "S-780 (continuous Electroless Nickel Plating Solution)" by Nippon Kanigen Co., Ltd. (no date).
Literature "Sumer" by Nippon Kanigen Co., Ltd. (no date).
Literature "Electroless Nickel Plating--Kanigen Process" by Nippon Kanigen Co., Ltd. (no date).
Patents Abstract of Japan, vol. 3, No. 41 (E-103), Apr. 10, 1979, p. 55 & JP-A-54 20 746 (Tokyo Shibaura Denki K.K.) 16-02-1979. *Abstract*
Horiuti Masao
Kodama Shun-ichi
Kuroda Kenji
Anritsu Corporation
Rosenberger Richard A.
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