Two wave length, scanning and integration type method of microsp

Details Two wave length, scanning and integration type method of microsp Two wave length, scanning and integration type method of microsp

1973-12-19

1977-03-15

Corbin, John K.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356205, G01J 342

Patent

active

040121461

ABSTRACT:
A two wave length, scanning and integration type method of microspectrophotometrically measuring the light absorbancy of a specimen dyed with a coloring matter comprising scanning the specimen by light spots having two different wave lengths and integrating electric signals converted from the light spots traversing the specimen. The two different wave lengths .lambda..sub.1 and .lambda..sub.2 are selected such that at the wave length .lambda..sub.1 the light absorbancy of the absorption spectrum of the coloring matter is maximum and that at the wave length .lambda..sub.2 the light absorbancy is zero and the wave length .lambda..sub.2 is deviated from the absorption spectrum and located near the wave length .lambda..sub.1. A true light absorbancy in proportion to the amount of light absorbing substance at that part of the specimen which is to be measured is obtained by subtracting the light absorbancy produced by the light loss not peculiar to the specimen and caused by the light diffusion due to light reflection, refraction and diffraction in the specimen from the light absorbancy peculiar to the specimen. A two wave length, scanning and integration type microspectrophotometer for automatically carrying out the method of measurement is also disclosed.

REFERENCES:
patent: 3781112 (1973-12-01), Groner et al.
patent: 3811781 (1974-05-01), Lowy
patent: 3813168 (1974-05-01), Honkawa
patent: 3887281 (1975-06-01), Kurita et al.

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