Two magnet asymmetric doubly achromatic beam deflection system

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

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250396ML, H01J 37147

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active

043895727

ABSTRACT:
The beam deflection system includes two dipole magnets for deflecting a charged particle beam in a deflection plane. The first magnet bends the beam in a path having a radius .rho..sub.1 and a deflection angle .theta..sub.1 greater than 180.degree.. The first magnet has an effective exit edge at an angle (90.degree.-.eta..sub.1) with respect to the beam path. The second magnet further bends the beam in a path having a radius .rho..sub.2 and a deflection angle .theta..sub.2 where 225.degree..ltoreq.(.theta..sub.1 +.theta..sub.2).ltoreq.280.degree.. The effective entry edge of the second magnet is at an angle of (90.degree.-.eta..sub.2) to the beam path. In the usual practical case the effective interior edges of the two magnets are roughly parallel, that is, .eta..sub.1 .perspectiveto.-.eta..sub.2 and the doubly achromatic properties are obtained to first order when the angles satisfy the following formula:

REFERENCES:
patent: 3135863 (1964-06-01), Hunt
patent: 3541328 (1970-11-01), Enge
patent: 3691374 (1972-09-01), Leboutet
patent: 3867635 (1975-02-01), Brown et al.
"Effect of Extended Fringing Fields on Ion-Focusing Properties of Deflecting Magnets", Enge, Review of Sci. Ins., Mar. 1964, pp. 278-287, vol. 35, No. 3.

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