Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-09-30
1995-06-20
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324457, G01R 2726
Patent
active
054263735
ABSTRACT:
A device for determining electrical properties of a dielectric material on a metal substratum is provided. First and second electrodes are suspended in a spaced apart relationship above the dielectric material thereby forming first and second air gaps, respectively, between the electrodes and the dielectric material. A resulting circuit path is formed that includes the first and second electrodes, the first and second air gaps, the dielectric material and the metal substratum. Changes in the measured complex impedance of the circuit path are indicative of the electrical properties of the dielectric material.
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Journal of Physics vol. 9. Jan. 26, 1976 Baker et al. A Simple Technique Measuring Nonlinear AC Properties of Materials at Frequencies Flow 1Hz.
Diamond Earl L.
Loeb George I.
Ross Angela M.
Miller Charles D.
Regan Maura K.
The United States of America as represented by the Secretary of
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