Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1983-11-22
1985-12-31
Haroian, Harry N.
Geometrical instruments
Gauge
Movable contact probe, per se
33169R, 33172E, G01B 728
Patent
active
045611904
ABSTRACT:
A two-directional touch sensor for use in a height gauge, other measuring instruments or the like, wherein an abutting contact with a workpiece (W) to be measured is detectable in two directions opposed to each other at 180.degree.. The main body (1) of sensor has a probe shaft (13) rotatably supported by the main body (1) and provided at one end with a spherical measuring element (18) and at the other end with a contacting element (20). When an abutting point (18A) or (18B) of the measuring element (18) being in abutting contact with the workpiece (W) is aligned with a neutral axis (M), the contacting element (20) comes into contact with either one of electric contact points (54B) and (54A) to emit a touch signal.
REFERENCES:
patent: 3235222 (1966-02-01), Nickell
patent: 3922791 (1975-12-01), Maxey et al.
Sakata Hideo
Sugizaki Iwao
Yamamoto Takeshi
Haroian Harry N.
Mitutoyo Mfg. Co. Ltd.
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