Two-dimensional spectral shearing interferometry for...

Optics: measuring and testing – By light interference

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S520000

Reexamination Certificate

active

07433043

ABSTRACT:
The phase spectrum of an ultrashort pulse is measured based on two-dimensional spectral shearing interferometry with zero delay. The measurement is performed utilizing an optical source pulse from which is extracted a short pulse and from which a chirped component is generated. The chirped component is split into first and second chirped pulses. The first and second pulses are then mixed with the short pulse in a nonlinear medium to produce up-converted and spectrally sheared copies of the first and second chirped pulses, which are measured in a spectrometer. A plurality of path lengths for the first second chirped pulses is provided to shift the relative phases of the first and second chirped pulses for additional measurements. The apparatus and methods are uniquely suited for characterizing single-cycle pulses.

REFERENCES:
patent: 5107351 (1992-04-01), Leib et al.
patent: 5359410 (1994-10-01), Diels et al.
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5553093 (1996-09-01), Ramaswamy et al.
patent: 6456380 (2002-09-01), Naganuma
patent: 6633386 (2003-10-01), Walmsley et al.
patent: 6683691 (2004-01-01), Grunwald et al.
patent: 7006230 (2006-02-01), Dorrer et al.
patent: 2003/0025911 (2003-02-01), Walmsley et al.
patent: PCT/US98/15355 (1998-07-01), None
Birge et al., “Two-dimensional spectral shearing interferometry for few-cycle pulse characterization”,Optics Lett., 31(13):2063-2065 (2006).
International Search Report and Written Opinion for PCT/US2006/047047 (Nov. 9, 2007), 11.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Two-dimensional spectral shearing interferometry for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Two-dimensional spectral shearing interferometry for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-dimensional spectral shearing interferometry for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4003462

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.