Optics: measuring and testing – By shade or color – With color transmitting filter
Reexamination Certificate
1999-01-07
2001-04-24
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By shade or color
With color transmitting filter
C250S226000
Reexamination Certificate
active
06222631
ABSTRACT:
This application is based on application No. 10-2371 filed in Japan, the content of which is hereby incorporated by reference.
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a two-dimensional spectral characteristic measuring apparatus for measuring the two-dimensional spectral characteristics of a sample.
2. Description of the Related Art
In order to measure the two-dimensional, or planar spectral characteristics of a sample, the following methods (1) through (3) have conventionally been used.
(1) A turntable having a plurality of band-pass filters of which the passbands are different from one another is arranged between a sample and an imaging means for imaging a two-dimensional image of the sample, and this turntable is turned to sequentially change the filters through which light from the sample penetrates.
(2) There is provided a plurality of sets having filters of which the passbands are different from one another, each set being comprised of a band-pass filter of a very small size and an imaging means, and they are made to scan a sample.
(3) A plurality of dichroic mirrors of which the light reflection wavelengths are different from one another are arranged parallel to each other, and imaging means corresponding to the directions in which lights from a sample are reflected are arranged, whereby the two-dimensional image of the sample is imaged by the imaging means.
However, the above methods (1) and (2), which necessitate the turning of the turntable and a structure for scanning the aforementioned sets, lead to a complicated apparatus. Furthermore, much time is necessary for the turning operation and the scanning operation, and this has led to the problem that the measurement cannot be executed in a short time.
In the case where the turntable is turned to change the filter, the spectral characteristics at different wavelengths cannot be simultaneously measured. In the case where the aforementioned sets are made to scan, the two-dimensional spectral characteristics cannot be simultaneously measured. Therefore, both of the above methods have had the problem that a moving sample cannot be correctly measured.
According to the above method (3), the measurement can be executed in a short time and spectral characteristics at different wavelengths can be simultaneously obtained.
However, the method necessitates a number of processing circuits for processing the data about the received light, outputted from the imaging means by the number corresponding to the number of the imaging means. This has led to the problem that the circuit scale of the processing circuit increases and the apparatus construction becomes complicated.
SUMMARY OF THE INVENTION
The present invention solves the aforementioned problems and has an object to provide a two-dimensional spectral characteristic measuring apparatus capable of simultaneously measuring the two-dimensional spectral characteristics with a simple construction.
The two-dimensional spectral characteristic measuring apparatus of the present invention comprises: a collimator lens which transforms a sample light from a sample into a pencil of parallel light; a plurality of band-pass filters which have mutually-different passbands; a plurality of lenses that are arranged in correspondence with the band-pass filters and converge the sample lights in specified image-forming positions to form two-dimensional images of the sample; and an image pick-up device which collectively picks up the plurality of two-dimensional images formed in the image-forming positions.
The two-dimensional spectral sensor for obtaining two-dimensional spectral information of the present invention comprises: a collimator lens for transforming the sample light from the sample into a pencil of parallel light; a plurality of band-pass filters having mutually-different passbands; a plurality of lenses that are provided in correspondence with the band-pass filters and form a plurality of two-dimensional images of the sample in specified image-forming positions; and an imaging device for collectively imaging the plurality of two-dimensional images formed in the image-forming positions.
According to these constructions, the sample light from the sample is transformed into the pencil of parallel light by the collimator lens and is spectrally separated by the band-pass filters. The plurality of two-dimensional images of the sample are formed in the specified image-forming positions by the lenses corresponding to the band-pass filters. Then, the plurality of two-dimensional images formed in this image-forming positions are collectively imaged, by which the two-dimensional spectral characteristics of the sample are simultaneously measured with the simple construction.
These and other objects, advantages and features of the invention will become apparent from the following description thereof taken in conjunction with the accompanying drawings which illustrate specific embodiments of the invention.
REFERENCES:
patent: 5214494 (1993-05-01), Inaba et al.
patent: 5306233 (1994-04-01), Kawagoe et al.
patent: 5432609 (1995-07-01), Sugiyama et al.
patent: 5457530 (1995-10-01), Nagai
patent: 5479015 (1995-12-01), Rudman et al.
patent: 5589934 (1996-12-01), Hosoi et al.
patent: 5592294 (1997-01-01), Ota et al.
patent: 5636015 (1997-06-01), Imura et al.
patent: 5729011 (1998-03-01), Sekiguchi
patent: 5926283 (1999-07-01), Hopkins
patent: 6031619 (2000-02-01), Wilken et al.
Evans F. L.
McDermott & Will & Emery
Minolta Co. , Ltd.
LandOfFree
Two-dimensional spectral characteristic measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Two-dimensional spectral characteristic measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-dimensional spectral characteristic measuring apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2539618