Measuring and testing – Vibration – By mechanical waves
Patent
1982-02-19
1984-03-06
Goldberg, Gerald
Measuring and testing
Vibration
By mechanical waves
73633, 324262, 74 58, G01N 2904
Patent
active
044346590
ABSTRACT:
An X-Y scanner is illustrated which utilizes an eddy current or ultrasonic current test probe for detecting surface defects in small flat plates and the like. The apparatus includes a scanner C which travels on a pair of slide tubes (20) in the X-direction. The scanner is, in turn, carried on a carriage B which slides in the Y-direction. The scanner C is driven in the X-direction by means of a helix shaft (44) having a closed-loop helix groove (46) in which a follower pin 38 carried by scanner C rides. The carriage B is moved incrementally in the Y-direction upon the completion of travel of the scanner back and forth in the X-direction by means of an indexing means E which includes an indexing actuator (54) and an indexing gear (50). Actuator (54) is in the form of a ratchet which engages ratchet gear (52) upon return of the scanner to the indexing position whereupon the indexing gear (50) is rotated a predetermined increment along a rack gear (48) to move carriage B incrementally in the Y-direction. Thus, simplified highly responsive mechanical motion may be had in a small lightweight portable unit for accurate scanning of small areas.
REFERENCES:
patent: 2182522 (1939-12-01), Lindsey
patent: 3501968 (1970-03-01), Fredell
patent: 3898838 (1975-08-01), Connelly
patent: 4170145 (1979-10-01), Kennedy et al.
patent: 4294118 (1981-10-01), Shiraiwa et al.
patent: 4304133 (1981-12-01), Feamster
Bankston Ben F.
Kurtz George W.
Beumer Joseph H.
Chapman, Jr. John E.
Goldberg Gerald
Manning John R.
The United States of America as represented by the Administrator
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