Two dimensional non-field perturbing, diode detected, double gap

Details Two dimensional non-field perturbing, diode detected, double gap Two dimensional non-field perturbing, diode detected, double gap

1985-05-10

1987-03-03

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With waveguide or long line

324 725, G01R 2304

Patent

active

046478493

ABSTRACT:
A two dimensional portable double gap detected probe for measuring B fields n large test volumes which are remote from electrical power. The probe is small, portable, and constructed for minimum field perturbation. The output of the probe is read by an ordinary high impedance volt meter, which is easily portable, and does not require external power.

REFERENCES:
patent: 4207518 (1980-06-01), Hopfer
patent: 4392108 (1983-07-01), Hopfer
patent: 4588993 (1986-05-01), Babij et al.

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