Two-dimensional imaging backscatter probe

Details Two-dimensional imaging backscatter probe Two-dimensional imaging backscatter probe

1996-08-07

1998-06-09

Tokar, Michael J.

Radiant energy

Invisible radiant energy responsive electric signalling

With means to inspect passive solid objects

378 57, G01N 23203, G01N 2310

Patent

active

057638861

ABSTRACT:
A two-dimensional imaging backscatter probe has a radiation source, a radiation detector, and a position sensing device to which the radiation detector is attached. A mapping circuit generates a two-dimensional map of backscattered radiation as a function of position of the radiation detector. A display displays the two-dimensional map. The two-dimensional imaging backscatter probe of the present invention facilitates non-destructive
on-intrusive inspection of a test article for contraband and/or structural integrity inspection.

REFERENCES:
patent: 5600303 (1997-02-01), Husseiny et al.
patent: 5600700 (1997-02-01), Krug et al.

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