Image analysis – Pattern recognition – Feature extraction
Patent
1992-01-22
1996-10-22
Boudreau, Leo
Image analysis
Pattern recognition
Feature extraction
382203, 382241, G06K 946
Patent
active
055685676
ABSTRACT:
Two-dimensional image data of an object is processed to inspect a circular arc configuration of the object. Initially, the two-dimensional image data is subjected to a data extraction process in which image edge points of the circular arc configuration of the object are extracted from the two-dimensional image data. The image edge points are then applied to a process to approximate the circular arc configuration of the object by defining a circle which minimizes a mean value of a fourth power error of the image edge points relative to the circle, the thus defined circle being used to approximate the circular arc configuration of the object.
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patent: 4644583 (1987-02-01), Watanabe et al.
patent: 4797939 (1989-01-01), Hoki et al.
patent: 4914601 (1990-04-01), Smyth
Boudreau Leo
Kelley Chris
Matsushita Electric - Industrial Co., Ltd.
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