Optics: measuring and testing – Dimension – Thickness
Reissue Patent
2008-03-21
2010-11-02
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Dimension
Thickness
C356S369000, C359S202100
Reissue Patent
active
RE041906
ABSTRACT:
A two dimensional beam deflector is disclosed which deflects beams from multiple optical assemblies. The input of beams of the multiple optical assemblies follow parallel optical paths until deflection to a wafer. An ellipsometer using a two-dimensional beam deflector is also disclosed.
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Browdy and Neimark PLLC
Nova Measuring Instruments Ltd.
Pham Hoa Q
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