Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Reexamination Certificate
2006-10-03
2006-10-03
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
C374S120000, C250S330000, C250S338100, C250S336100, C250S339020
Reexamination Certificate
active
07114846
ABSTRACT:
A two-color radiation thermometer includes an image pickup device having micro photo receiving units arranged two-dimensionally; a light diverging device for diverging incident light coming from a measuring object into two paths and irradiating the light on two different areas on a two-dimensional light receiving surface of the image pickup device; a wavelength limitation device for limiting wavelengths of the light irradiated on the two different areas to first and second wavelengths, respectively; and a temperature calculation device. The calculation device receives image signals corresponding to the first and second wavelengths respectively from the micro photo receiving units located at the two different areas, and calculates the temperature of the measuring object based on the two image signals.
REFERENCES:
patent: 4651001 (1987-03-01), Harada et al.
patent: 4659234 (1987-04-01), Brouwer et al.
patent: 4751571 (1988-06-01), Lillquist
patent: 4755673 (1988-07-01), Pollack et al.
patent: 4967276 (1990-10-01), Murakami et al.
patent: 5216252 (1993-06-01), Boone et al.
patent: 5219226 (1993-06-01), James
patent: 5656813 (1997-08-01), Moore et al.
patent: 5686889 (1997-11-01), Hillis
patent: 5910816 (1999-06-01), Fontenot et al.
patent: 6009340 (1999-12-01), Hsia
patent: 6121616 (2000-09-01), Trigg
patent: 6393056 (2002-05-01), Talluri et al.
patent: 6640130 (2003-10-01), Freeman et al.
patent: 6682216 (2004-01-01), Small, IV et al.
patent: 6814484 (2004-11-01), Yano et al.
patent: 6969856 (2005-11-01), Hillenbrand et al.
patent: 2002/0030163 (2002-03-01), Zhang
patent: 2002/0186304 (2002-12-01), Kono et al.
patent: 2002/0186976 (2002-12-01), Seo
patent: 2003/0108083 (2003-06-01), Seitz
patent: 2003/0173518 (2003-09-01), Ozaki
patent: 2003/0227680 (2003-12-01), Chen et al.
patent: 2004/0208230 (2004-10-01), Lee et al.
patent: 2005/0265423 (2005-12-01), Mahowald et al.
patent: 07246185 (1995-09-01), None
patent: 2002303553 (2002-10-01), None
patent: 2003-315159 (2003-11-01), None
patent: 2005229317 (2005-08-01), None
Kondo Yasushi
Ohkubo Kunihiko
Tominaga Hideki
Kanesaka Manabu
Shimadzu Corporation
Verbitsky Gail
LandOfFree
Two-color radiation thermometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Two-color radiation thermometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-color radiation thermometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3628378