Active solid-state devices (e.g. – transistors – solid-state diode – Tunneling pn junction device
Reexamination Certificate
2006-01-03
2006-01-03
Tran, Thien F. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Tunneling pn junction device
Reexamination Certificate
active
06982439
ABSTRACT:
A tunnel junction device (102) with minimal hydrogen passivation of acceptors includes a p-type tunnel junction layer (106) of a first semiconductor material doped with carbon. The first semiconductor material includes aluminum, gallium, arsenic and antimony. An n-type tunnel junction layer (104) of a second semiconductor material includes indium, gallium, arsenic and one of aluminum and phosphorous. The junction between the p-type and an-type tunnel junction layers forms a tunnel junction (110).
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Bhat Rajaram
Nishiyama Nobuhiko
Agon Juliana
Corning Incoporated
Paglierani Ronald J.
Tran Thien F.
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