Measuring and testing – Navigation – Take-off and landing monitors
Patent
1991-04-15
1993-11-30
Woodiel, Donald O.
Measuring and testing
Navigation
Take-off and landing monitors
33300, 73763, 738626, 73862634, 257415, G01C 2100, G01L 104
Patent
active
052654702
ABSTRACT:
Methods and apparatus for measuring gravitational and inertial forces, magnetic fields, or wave or radiant energy acting on an object or fluid in space provide an electric tunneling current through a gap between an electrode and that object or fluid in space and vary that gap with any selected one of such forces, magnetic fields, or wave or radiant energy acting on that object or fluid. These methods and apparatus sense a corresponding variation in an electric property of that gap and determine the latter force, magnetic fields, or wave or radiant energy in response to that corresponding variation, and thereby sense or measure such parameters as acceleration, position, particle mass, velocity, magnetic field strength, presence or direction, or wave or radiant energy intensity, presence or direction.
REFERENCES:
patent: 3545090 (1970-12-01), Anthony
patent: 3564890 (1971-02-01), Catapano
patent: 4445376 (1984-05-01), Merhav
patent: 4566023 (1986-01-01), Hansma et al.
patent: 4618767 (1986-10-01), Smith et al.
patent: 4638669 (1987-01-01), Chou
patent: 4724318 (1988-02-01), Binnig
patent: 4823004 (1989-04-01), Kaiser et al.
patent: 4861990 (1989-08-01), Coley
Russell Young, John Ward, and Fredric Scire, The Topografiner: An Instrument for Measuring Surface Microtopography, Rev. Sci. Instrum., 1972, 43, 999.
G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Tunneling Through A Controllable Vacuum Gap, Appl. Phys. Lett., 1982, 40, 178.
Drs. G. Binnig, C. F. Quate and Ch. Gerber, Atomic Force Microscope, Phys. Rev. Lett., 1986, 56, 930.
G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Surface Studies By Scanning Tunneling Microscopy, Phys. Rev. Lett., 1982, 49, 57, of IBM Zurich Research Laboratory.
U. Durig, J. K. Gimzewski and D. W. Phol, Experimental Observation of Forces Acting During Scanning Tunneling Microscopy, Phy. Rev. Lett., 1986, 57, 2403.
Gary M. McClelland, Ragnar Erlandsson and Shirley Chiang, Atomic Force Microscopy: General Principles and a New Implementation, accepted for publication in Review of Progress in Quantitative Non-Destructive Evaluation, vol. 6, Plenum, NY (1987).
Ch. Gerber, B. Binnig, H. Fuchs, O. Marti and H. Rohrer, Scanning Tunneling Microscope Combined With a Scanning Electron MicroscopeRec. Sci. Instrum., 1986, 57, 221.
G. Binnig and H. Rohrer, Scanning tunneling microscopy, Helvetica Physica Acta, vol. 55 (1982) 726-735.
Calvin F. Quate, Vacuum tunneling: A new technique for microscopy, Phys. Today (Aug. 1986) 26-33.
K. E. Petersen, A Shartel, and N. F. Raley, Micromechanical Accelerometer Integrated with MOS Detection Circuitry, IEEE Trans. Electron Devices, Ed-29, 23 (1982).
K. E. Petersen, Dynamic Micromechanics on Silicon: Techniques and DevicesIEEE Trans. Electron Devices, ED-25, 1241 (1978).
T. G. Reynolds III and D. M. Tanka, Consider Piezoelectric Ceramics, Electronic Design 19, pp. 92 to 97 (Sep. 1977).
G. Binnig and H. Rohrer, Scanning Tunneling Microscopy, IBM J. Res. Develop. 30, 355 (1986).
F. Rudolf, Silicon Microaccelerometer, Sensors and Actuators 4, 191 (1983).
C. S. Sander et al, A Monolithic Capacitive Pressure Sensor with Pulse-Period Output, IEEE Trans. Electron Devices ED-27,927 (1980).
K. E. Petersen, Silicon as a Mechanical Material, Proc. IEEE 70, 420 (1982).
M. J. S. Smith et al, Analysis, Design, and Performance of a Capacitive Pressure Sensor IC, IEEE Trans. Biomed. Eng. BME-33, 163 (1986).
M. E. Welland et al, Spatial location of electron trapping defects on silicon by scanning tunneling microscopy, Appl. Phys. Lett. 48, 724 (1986).
J. B. Pendry et al, Electroncs at Disordered Surfaces and 1/f Noise, Phys. Rev. Lett. 57, 2983 (1986).
D. L. Gardner et al, A Fiber-Optic Interferometric Seismometer, J. Lightwave Tech. LT-5, 953 (1987).
D. Rugar, Force microscope using a fiber-optic displacement sensor, Rev. Sci. Instrum. 59, 11 (1988).
A. A. Baski et al, Tunneling accelerometer, J. of Microscopy 152, 73 (1988).
M. F. Bocko et al, Vacuum Tunneling Probe: A Nonreciprocal, Reduced-Back-Action Transducer, Phys. Rev. Lett. 61, 726 (1988).
D. W. Abraham et al, Noise reduction technique for scanning tunneling microscopy, Appl. Phys. Lett. 53, 1503 (1988).
J. H. Wandass et al, Mag
Kaiser William J.
Kenny Thomas W.
Waltman Steven B.
California Institute of Technology
Woodiel Donald O.
LandOfFree
Tunnel effect measuring systems and particle detectors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tunnel effect measuring systems and particle detectors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tunnel effect measuring systems and particle detectors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2087808