Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-01
2008-07-01
Hirshfeld, Andrew H (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S538000, C324S686000
Reexamination Certificate
active
11440383
ABSTRACT:
A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected signal traces during a test mode of device operation, and tuning circuit characteristics of the test trace to generate a bandpass frequency response including a passband and a stopband, where a detection frequency corresponding either to the test frequency or a selected harmonic of the test frequency is included in the passband. Tuning of circuit characteristics may include selecting a degree of capacitive coupling between the test trace and the signal traces such that, within a specified constraint for signal degradation on the signal traces, the bandpass frequency response of the given test trace satisfies a specified transmission requirement at the detection frequency.
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Chakrabarti Prabhansu
Wang Margaret H.
Dole Timothy J
Hirshfeld Andrew H
Kowert Robert C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Petro Anthony M.
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