Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-01
2008-07-01
Hirshfeld, Andrew H (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S538000, C324S686000
Reexamination Certificate
active
07394260
ABSTRACT:
A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected signal traces during a test mode of device operation, and tuning circuit characteristics of the test trace to generate a bandpass frequency response including a passband and a stopband, where a detection frequency corresponding either to the test frequency or a selected harmonic of the test frequency is included in the passband. Tuning of circuit characteristics may include selecting a degree of capacitive coupling between the test trace and the signal traces such that, within a specified constraint for signal degradation on the signal traces, the bandpass frequency response of the given test trace satisfies a specified transmission requirement at the detection frequency.
REFERENCES:
patent: 5363048 (1994-11-01), Modlin et al.
patent: 5486753 (1996-01-01), Khazam et al.
patent: 6104198 (2000-08-01), Brooks
patent: 6868021 (2005-03-01), Tanabe et al.
patent: 6933730 (2005-08-01), Parker et al.
patent: 6960917 (2005-11-01), Parker et al.
patent: 6984991 (2006-01-01), Bond et al.
patent: 7012811 (2006-03-01), Jiang et al.
patent: 7075307 (2006-07-01), Williamson
patent: 2004/0164755 (2004-08-01), Yamaoka et al.
patent: 2004/0227527 (2004-11-01), Bortesi et al.
patent: 2006/0095817 (2006-05-01), Lee et al.
patent: 2007/0115004 (2007-05-01), Mirov et al.
patent: 0 805 356 (1997-11-01), None
patent: 2143954 (1985-02-01), None
patent: 2 405 215 (2005-02-01), None
patent: 2001201753 (2001-07-01), None
patent: 02/082109 (2002-10-01), None
patent: 2004/025315 (2004-03-01), None
Cangellaris et al., “Interactive Tutorial on Fundamentals of Signal Integrity for High-Speed/High Density Design,” Design Automation Conference, 2001.
Chakrabarti Prabhansu
Wang Margaret H.
Dole Timothy J
Hirshfeld Andrew H
Kowert Robert C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Petro Anthony M.
LandOfFree
Tuning a test trace configured for capacitive coupling to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tuning a test trace configured for capacitive coupling to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tuning a test trace configured for capacitive coupling to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2751878