Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Beam of atomic particles
Patent
1986-09-22
1988-06-21
Pellinen, A. D.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Beam of atomic particles
324 57Q, 324 58R, 324 585R, 324318, 334 71, 333235, G01N 2702
Patent
active
047527285
ABSTRACT:
A frequency domain sensing system is disclosed for sensing the position of a high energy beam of charged particles traveling within a housing which comprises a plurality of sensors positioned in the wall of the housing radially around the axis of the beam. Each of the sensors further comprises a first electrode of predetermined shape received in a bore in the housing to define a fixed capacitance and an inductance structure attached to the electrode to provide an inductance for the sensing means which will provide an LC circuit which will resonate at a predetermined frequency known to exist in the beam of charged particles. The sensors are further provided with tuning apparatus associated with the inductance structure to vary the amount of the inductance to thereby tune the sensors to the predetermined frequency prior to transmission of the signal to signal detection circuitry.
REFERENCES:
patent: 1622389 (1927-03-01), Miessner
patent: 2513393 (1950-07-01), Frey et al.
patent: 2558482 (1951-06-01), Galitz
patent: 2601338 (1952-06-01), Snyder
patent: 2694150 (1954-11-01), Bussard
patent: 2803804 (1957-08-01), Kihn
patent: 2952771 (1960-09-01), Lytle
patent: 3378795 (1968-04-01), Harris et al.
patent: 3573834 (1971-04-01), McCabe et al.
patent: 3588902 (1971-06-01), Willie et al.
patent: 3857090 (1974-12-01), Chick
patent: 4060762 (1977-11-01), McKeown
patent: 4066988 (1978-01-01), Karp
patent: 4134017 (1979-01-01), Azam et al.
patent: 4313121 (1982-01-01), Campbell et al.
patent: 4620155 (1986-10-01), Edelstein
patent: 4658153 (1987-04-01), Brosh et al.
Nakamura Michiyuki
Nolan Marvin L.
Clouse, Jr. Clifton E.
Gaither Roger S.
Hightower Judson R.
Pellinen A. D.
The United States of America as represented by the United States
LandOfFree
Tunable resonant sensing means to sense a particular frequency i does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tunable resonant sensing means to sense a particular frequency i, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tunable resonant sensing means to sense a particular frequency i will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-931095