Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-11-09
1989-08-01
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158F, 324 73PC, 324 725, 333246, G01R 104, H01P 522
Patent
active
048536245
ABSTRACT:
Tuning elements are mounted on a coplanar waveguide probe adapted to be used for on-wafer microwave noise measurement of integrated circuit devices. Each of the tuning elements is a capacitive varactor which is connected between a respective position on the input signal line of the probe and a respective capacitor to ground for the injection of bias voltage. The input signal line carries a gate voltage for the wafer device under test, and the differential voltage between the gate voltage and the bias voltage applied to the respective varactor determines the capacitance presented to the signal line by the varactor. The impedance of the signal line at the point where the probe contacts the wafer can be varied by adjusting the bias voltages applied to the varactors. The position at which each of the varactors is connected to the input signal line depends upon the wavelength of the input signal and is normally less than two wavelengths of the input signal from the end of the probe that contacts the wafer.
REFERENCES:
patent: 4806890 (1989-02-01), Gurcan et al.
Rabjohn et al.; "High-Frequency Wafer Probing Techniques", Canadian Journal of Physics; vol. 65; pp. 850-855; 1987.
Lane; "Session XIII: Microwave Oscillators, Power Combiners and Measurement Techniques"; ISSCC 78/Thursday, Feb. 16, 1978/Continental Ballroom 6/4:15 PM; pp. 272-274.
Strid et al.; "A DC-12 GHZ Monolithic GaAsFET Distributed Amplifier"; IEEE Transactions on Electron Devices; vol. ED. 29, No. 7; Jul. 1982; pp. 1065-1071.
Gleason et al.; "Microwave Wafer Probing"; Microwave Journal; Jan. 1985; pp. 121-129.
Perlow; "New Algorithms for the Automated Microwave Tuner Test System"; RCA Review; vol. 46; Sep. 1985; pp. 341-355.
"An On Wafer Noise Parameter and S-Parameter Measurement System"; Microwave Journal; Sep. 1988; pp. 275-278.
"Introducing the World's First Microwave Wafer Probing Equipment"; Cascade Microtech; 1983-1985.
Eisenzopf Reinhard J.
Jones Philip W.
Nguyen Vinh P.
Northern Telecom Limited
LandOfFree
Tunable microwave wafer probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tunable microwave wafer probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tunable microwave wafer probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-133643