Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1991-04-23
1992-05-05
Cuchlinski, Jr., William A.
Geometrical instruments
Gauge
Movable contact probe, per se
33561, 33556, 33503, G01B 503, G01B 703
Patent
active
051096102
ABSTRACT:
The present invention is directed to a contact-type probe for obtaining positional information concerning a workpiece characteristic, simultaneously in more than one positional axis. The probe comprises a probe body for mounting in a machine tool and to which other components may be mounted, a double swivel joint mounted to the probe body and a probe shaft mounted to the swivel and carrying a workpiece contact on one end. In operation, the workpiece contact attached to the probe shaft is moved over the workpiece, and the contact engages a characteristic such as an aperture in the workpiece. The probe body remains in a defined position, while the probe shaft may swivel in two axes to engage the characteristic. The magnitude of displacement necessary for the probe shaft to engage the characteristic may be determined to provide positional information concerning the characteristic.
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Cuchlinski Jr. William A.
Wirthlin Alvin
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