Trochoidal analysis of scattered electrons in a merged electron-

Details Trochoidal analysis of scattered electrons in a merged electron- Trochoidal analysis of scattered electrons in a merged electron-

1988-02-11

1989-04-04

Anderson, Bruce C.

Radiant energy

Calibration or standardization methods

250397, H01S 100, G01K 108, H01J 314

Patent

active

048188689

ABSTRACT:
The method and apparatus of this invention provides a plurality of measurements indicative of the absolute cross section for excitation of an ion beam. The ion beam is merged for excitation by specific energies of electrons in an electron beam. Both beams are merged in an evacuated enclosure having a longitudinal magnetic field and a crossed uniform electric field. The ions and electrons interact over a known merged longitudinal length in a merged beam area. After collision, the electron and ion beams are demerged. Forward and backward-scattered electrons are collected and position-detected by a pair of microchannel plate arrays located at opposite ends of the longitudinal beam-merging area. A series of electron and ion primary current measurements are taken at full ion and electron beam strength. Measurements are also taken at greatly reduced beam strength to obtain a beam overlap profile.

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